Unrivaled Precision for Laboratory-Grade Color Analysis
Elevate Color Quality with Stable Xenon Illumination & Benchtop Performance. YS6080 Color Spectrophotometer is a high-tech device analyzing light’s spectral composition to measure color accurately. Using diffraction gratings or prisms, it splits light into wavelengths, enabling precise quantification of color parameters like hue, saturation, and brightness.
Key Highlights
360nm-780nm Xenon Lamp, 400nm/420nm/460nm cut-off Xenon Lamp
High accuracy: Repeatability up to ΔE*ab 0.12
Inter - instrument Error Control (ΔE * AB≤0.12)
7" TFT Capacitive Screen-touch Display
Data Storage: Standard 4000 Pcs, Sample 50000 Pcs
Ideal for color analysis within R&D and laboratory environments
YS6080 is a benchtop grating spectrophotometer which is developed by 3nh independently with independent intellectual property. YS6080 has many features, like 7 inches TFT capacitive touch screen display, full illuminants, reflective d/8 and transmissive d/0 geometry (including or excluding UV). With very stable and precise color measurement, large storage and powerful PC software all makes YS6080 ideal for color analysis within R&D and laboratory environments.

Features
1, High configuration of hardware: 7 inches TFT Color Capacitive Touch-screen Display; Bluetooth 2.1; Concave Grating.
2, Double Array 256 Image Element CMOS Sensor; Long life-span stable xenon lamp.
3, With reflective and transmissive spectrum, accurate Lab value, good to calculate color formula and do precise color transmission.
4, Auto identify measuring aperture. Freely switchable between 3 measuring apertures: Φ 25.4mm/8mm/4mm. Users also can customize apertures.
5, Built-in temperature sensor to monitor and compensate the measuring temperature to ensure the measurement more precision.
6, Wavelength range 360nm – 780nm. Built-in 400nm/420nm/460nm cut off Xenon lamp, more professional in UV measurement.
7, Independent light source detector, continuously monitor the condition of light sources to ensure the light source reliable.
8, Multiple measurement modes: Quality Management Mode, Sample Mode; Meet more users’ requirement.
9,A variety of optional accessories: Reflection sample holding tool, transmission fixture, micro 4mm aperture transmission test components, instrument inversion test components, applicable to more working conditions.
10, Big capacity data storage, for 20000 pieces test result.
11, Built-in camera locating.
12, More powerful extended functions at the PC software.
Application Industry
YS6080 benchtop spectrophotometer is used to do precise color analysis and transmission in laboratories. It can be widely applied in different industries, such as plastics, electronics, paint and ink, printing, garments, leather, paper, auto, medical, cosmetics, food, science institutes, laboratories.
Meet more needs for customers
The instrument is equipped with a variety of optional accessories: Micro printer, instrument inverted test fixture, petri dish, Meet customer multi-sample measurement.

It can be used to test liquid reagents, sauces (such as ketchup, paint), powders (such as coffee), color masterbatches, etc.

Microhole (4mm) transmission test fixture assembly, Make sure the petri dish is fixed for measurement.

Easy film sample measurement.

Meet more sample measurement needs; Measurement is more convenient and flexible.
| Model | YS6080(Pulsed xenon lamp) |
| Optical Geometry | Reflect: di:8°, de:8°(diffused illumination, 8-degree viewing angle); SCI (specular component included)/SCE (specular component excluded);Include UV / excluded UV light source; Transmittance: di:0°, de:0° (diffuse illumination: 0° viewing); SCI (specular component included)/SCE (specular component excluded);Include UV / excluded UV light source; Haze(ASTM D1003); Conforms to CIE No.15,GB/T 3978,GB 2893,GB/T 18833, ISO7724/1, ASTM E1164, DIN5033 Teil7 |
| Integrating Sphere Size | Φ 154mm |
| Light Source Device | 360nm-780nm Xenon Lamp, 400nm cut-off Xenon Lamp,420nm cut-off Xenon Lamp,460nm cut-off Xenon Lamp |
| Spectrophotometric Mode | Concave Grating |
| Sensor | 256 Image Element Double Array CMOS Image Sensor |
| Wavelength Range | 360-780nm |
| Wavelength Pitch | 10nm |
| Semiband Width | 5nm |
| Reflectance Range | 0~200% |
| Measuring Aperture | Reflective : Φ30mm/Φ25.4mm, Φ18mm/Φ15mm, Φ10mm/Φ8mm, Φ6mm/Φ4mm; Transmissive : Φ30mm/Φ25mm;Remark: 1. Automatic identification of switch caliber 2. Customized Configuration caliber and lens position |
| Specular Component | Reflectance: SCI&SCE Transmittance: SCI&SCE |
| Color Space | CIE Lab, XYZ, Yxy, LCh, CIE LUV, Hunter LAB, Munsell, s-RGB, HunterLab, DIN, βxy |
| Color Difference Formula | ΔE*ab, ΔE*uv, ΔE*94, ΔE*cmc(2:1), ΔE*cmc(1:1), ΔE*00v, ΔE(Hunter), DIN ΔE99 |
| Colorimetric Index | WI (ASTM E313, CIE/ISO, AATCC, Hunter), YI (ASTM D1925, ASTM 313), APHA/Hazen/Pt-Co, Saybolt MI (Metamerism Index), Staining Fastness, Color Fastness, Color Strength, Opacity, Gardner Index, 555 Index, Haze(ASTM D1003) |
| Observer Angle | 2° & 10° |
| Illuminants | D65,A,C,D50,D55,D75, F1,F2,F3,F4,F5,F6, F7,F8,F9,F10,F11,F12, CWF,DLF,TL83,TL84,TPL5,U30 |
| Displayed Data | Spectrogram/Values, Chromaticity Values, Color Difference Values/Graph, Pass/Fail Result, Color Offset |
| Measuring Time | About 2.4s (Measure SCI & SCE about 5s) |
| Repeatability | Spectral reflectance: Φ25.4mm/SCI, Standard deviation within 0.06% (400 nm to 700 nm: within 0.05%) Chromaticity value: Φ25.4mm/SCI, Standard deviation within ΔE*ab 0.012 (When a white calibration plate is measured 30 times at 5 second intervals after white calibration) Spectral Transmittance: Φ25.4mm/SCI, Standard deviation within 0.06% (400 nm to 700 nm: within 0.06%) Chromaticity value: Φ25.4mm/SCI, Standard deviation within ΔE*ab 0.015 (When a white calibration plate is measured 30 times at 5 second intervals after white calibration) |
| Inter-instrument Error | Φ25.4mm/SCI, Within ΔE*ab 0.12 (Average for 12 BCRA Series II color tiles) |
| Size | 370×300×200mm |
| Weight | About 9.6kg |
| Power Supply | DC 24V, 3A Power Adapter |
| Light Source Device Life | 5 years, more than 3 million times measurements. |
| Display | 7" TFT Capacitive Screen-touch Display |
| Data Port | USB & Bluetooth & Print serial port |
| Data Storage | Standard 5000 Pcs, Sample 40000 Pcs |
| Language | Simplified Chinese, Traditional Chinese, English, (Optional Customized German, French and Spanish) |
| Working Environment | Temperature: 0~40℃; Humidity: 0~85% (No Condensation) |
| Storage Environment | Temperature: -20~50℃; Humidity: 0~85% (No Condensation) |
| Standard Accessory | Power Adapter, User Guide, CD Disk(PC Software), USB cable, Standard Calibration Board, Black Calibration Cavity, Transmission black baffle, Sample holder, 25.4 caliber, 15 caliber, 8 caliber, 4 caliber,Transmissive Test Component |
| Optional Accessory | Micro-printer, Micro Aperture(4mm) transmission test clamp component, Instrument inversion components, culture dish |
| Notes: The specifications are subject to change without notice. | |
FAQs About Benchtop Spectrophotometers
Spectrophotometers can only measure haze if it has haze measuring capabilities, as many measure color and transmittance.
Samples should be cleaned, dried, and scratched-free to obtain consistent haze measurements.
Powder paint gloss levels are classified as:
● Flat: 0–10 GU
● Satin: 11–40 GU
● Semi-gloss: 41–70 GU
● Gloss: 71–85 GU
● High Gloss: 86+ GU
These are measured at a 60° angle for standardization.
Measuring zinc coating thickness is most commonly using magnetic induction. The gauge measures how far the magnetic probes are to the metal base under the zinc. This is the most reliable way to measure the thickness and the preservation of the galvanization.
A magnetic induction gauge measures galvanized coatings by sensing the zinc coating on steel and iron. The measurement tells how thick the protective coating is. This is done to ensure the prevention of rusting.
There are many factors that can influence accuracy such as surface roughness, temperature, substrate material, and calibration settings. For ferrous metals, external magnetic fields can also distort measurements. Proper calibration and preparation will help reduce the impact of these factors.
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